SEM-EDS
Analysis
Correlative
microscopy, Filter-Handling,
PSE
operating modes,
Spectra
and material databases
JOMESA PSE: Material Analysis |
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Optical microscope: JOMESA HFD |
Scanning electron microscope with EDS: JOMESA
PSE |
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Largest metallic particle (optical) |
Largest nonmetallic particle (optical) |
Largest metallic particle (SEM detail) |
Largest nonmetallic particle (SEM) |
Advantages of correlative microscopy:
Optical analysis is fast and cheap and shows the relevant particles.
Optical system and SEM-EDS system use a common database.
Both systems use the same software, the same user interface.
Using the optical results a material (spectral) analysis of the relvant particles can be quickly achieved.
Anaysis reports contain results of both systems.